Introduction Within ASML Research Metrology department, the Computational Methods for Metrology and Sensors(CMMS) group develops physics‑based simulations to model, study and assess metrology sensors in their application and inference methods that convert raw metrology sensor signals into manufacturing‑critical parameters. We
Introduction You will join the System Industrialization and Metrology Integration team in Veldhoven. This team connects data, system performance, and product quality across multiple development groups. The internship focuses on improving how machine data is collected, structured,
Introduction The Optical Column department in Veldhoven develops advanced optical metrology systems for semiconductor manufacturing. In this internship, you will help improve how images are corrected and analyzed using a digital twin environment. You contribute by exploring
Introduction The Optical Column department in Veldhoven develops advanced optical metrology systems for semiconductor manufacturing. In this internship, you contribute to improving a digital twin environment used to test and optimize algorithms. This digital twin supports faster
Introduction ASML YieldStar is an optical metrology tool that can quickly and accurately measure the quality of patterns on the wafer. In order to meet market-requirements we need to keep up to speed when it comes to