Introduction Within ASML Research Metrology department, the Computational Methods for Metrology and Sensors(CMMS) group develops physics‑based simulations to model, study and assess metrology sensors in their application and inference methods that convert raw metrology sensor signals into manufacturing‑critical parameters. We
Introduction The Optical Column department in Veldhoven develops advanced optical metrology systems for semiconductor manufacturing. In this internship, you contribute to improving a digital twin environment used to test and optimize algorithms. This digital twin supports faster