PhD – student: Machine learning for semiconductor wafer metrology As electronic chips continue to shrink while becoming increasingly powerful, their fabrication depends on achieving sub-nanometer precision at high speed and efficiency. At the heart of this
PhD - student: Machine learning for semiconductor wafer metrology ARCNL is a new type of public-private partnership between the University of Amsterdam, the VU University Amsterdam, the NWO, and ASML. Work Activities Klik hieronder op \Solliciteren\ om
ARCNL invites applications for a PhD student position focusing on machine learning for semiconductor wafer metrology. Denkt u de juiste kandidaat te zijn voor de volgende functie? Solliciteer dan na het lezen van de volledige omschrijving. The